Field-Emission Scanning Electron Microscope (FE‑SEM) System

Project ID: 6-B175-Q-00131-00 FederalOpportunitiesSolicitation

Overview

Agency	Department of Energy
Deadline	01/30/26
Posted	01/20/26
Estimated Value	Not Provided
Set Aside	None
NAICS	334516 - Analytical Laboratory Instrument Manufacturing
PSC	6640 - Laboratory Equipment And Supplies
Location	9700 S. Cass Ave. Lemont, IL 60439 United States

Description

Primary Latest Change

Summary

Posted: Jan. 20, 2026, 3:16 p.m. EST Argonne National Laboratory is seeking to procure the below. Please refer to the Statement of Work, attached, for further details and requirements. - Field-Emission Scanning Electron Microscope (FE SEM) System

Installation and Testing

If able to provide the items listed above, please submit your proposal addressing the following requirements by January 30, 2026, at 5:00 PM CST. For any questions, please contact jdoria@anl.gov no later than Januray 26, 2026, at 12:00 PM CST. - Signature on Page 1 of this document - Proposal - Vendor shall provide two (2) priced configurations: - Base System (no ultra-fast beam blanker) - Base System + Optional Ultra-Fast Beam Blanker (meeting the requirement above)

Shipping Origin

- If shipping from outside the USA, please confirm Incoterms of DAP are accepted. Additionally, please provide the appropriateHTS Code associated with order - If shipping from within the USA, please confirm Incoterms FOB Destination are accepted and that the quoted price includes allcosts associated with the order, and it will be the final price at invoicing.

Country of Origin

- ANL-70B (Complete)

Summary (Newest Update)

Background Argonne National Laboratory's Division of NanoScience and Technology (NST) is seeking to procure a Field-Emission Scanning Electron Microscope (FE-SEM) System as part of a recapitalization plan to update aging equipment. The current scanning electron microscopes are over 20 years old and require replacement to enhance analytical capabilities, particularly for critical mineral research. The new SEM will integrate advanced features such as a Wavelength Dispersive Spectrometer (WDS) and will significantly improve imaging performance with sub-nanometer spatial resolution. Work Details The contract includes the procurement of the following items: 1. Field-Emission Scanning Electron Microscope (FE-SEM) System, Model/Part: 1229004, Quantity: 1 Each. Specifications are detailed in the Statement of Work. 2. Installation and Testing, Model/Part: 1213963, Quantity: 1 Each. Further information is provided in the Statement of Work. The vendor must provide two priced configurations: - Base System (no ultra-fast beam blanker) - Base System + Optional Ultra-Fast Beam Blanker (meeting specified requirements). Place of Performance Argonne National Laboratory, located in Argonne, Illinois.

2: Posted: Jan. 21, 2026, 2:57 p.m. EST Argonne National Laboratory is seeking to procure the below. Please refer to the Statement of Work, attached, for further details and requirements. Field-Emission Scanning Electron Microscope (FE SEM) System Installation and Testing If able to provide the items listed above, please submit your proposal addressing the following requirements by January 30, 2026, at 5:00 PM CST. For any questions, please contact jdoria@anl.gov no later than Januray 26, 2026, at 12:00 PM CST. Signature on Page 1 of this document Proposal - Vendor shall provide two (2) priced configurations: Base System (no ultra-fast beam blanker) Base System + Optional Ultra-Fast Beam Blanker (meeting the requirement above) Lead Time Shipping Origin If shipping from outside the USA, please confirm Incoterms of DAP are accepted. Additionally, please provide the appropriateHTS Code associated with order If shipping from within the USA, please confirm Incoterms FOB Destination are accepted and that the quoted price includes allcosts associated with the order, and it will be the final price at invoicing. Country of Origin ANL-70B (Complete) Addendum 0001 (Review and Sign)

Current: Posted: Jan. 26, 2026, 1:39 p.m. EST Argonne National Laboratory is seeking to procure the below. Please refer to the Statement of Work, attached, for further details and requirements. Field-Emission Scanning Electron Microscope (FE SEM) System Installation and Testing If able to provide the items listed above, please submit your proposal addressing the following requirements by January 30, 2026, at 5:00 PM CST. For any questions, please contact jdoria@anl.gov no later than Januray 26, 2026, at 12:00 PM CST. Signature on Page 1 of this document Proposal - Vendor shall provide two (2) priced configurations: Base System (no ultra-fast beam blanker) Base System + Optional Ultra-Fast Beam Blanker (meeting the requirement above) Lead Time Shipping Origin If shipping from outside the USA, please confirm Incoterms of DAP are accepted. Additionally, please provide the appropriateHTS Code associated with order If shipping from within the USA, please confirm Incoterms FOB Destination are accepted and that the quoted price includes allcosts associated with the order, and it will be the final price at invoicing. Country of Origin ANL-70B (Complete) Addendum 0001 (Review and Sign) Addendum 0002 (Review)

Contacts