Low Voltage Compact Electron Microscope System

Summary (Newest Update)

Background The Radioisotope Science and Technology Division at Oak Ridge National Laboratory (ORNL), a U.S. Department of Energy (DOE) science and energy laboratory, is seeking a Low Voltage Compact Electron Microscope System to analyze samples. ORNL conducts basic and applied research to deliver transformative solutions in energy and security, managed by UT-Battelle, LLC. Work Details The contract involves the procurement of a Low Voltage Compact Electron Microscope System with the following specifications: 1. **LVEM 25E Base System:** - Fully self-contained and portable system on castors. - Schottky type Field Emission Gun (FEG) with automated alignment. - Integrated Ion Getter (imaging column) & enhanced Turbomolecular (airlock) Pumps. - Fully motorized aperture system. - Fully motorized stage (x, y, z) with automated coarse focus. - Computer configured with software for LVEM25E operations. - Two table mounted 24” flat panel high contrast LCD widescreen monitors. - New ergonomic work table with drawers. - Toolkit included. - Certified Installation & Customer-site training provided. - One year standard warranty included. 2. **Transmission Electron Microscope (TEM) Imaging Mode (25kV):** - Includes Electron Diffraction (ED). - 1.0nm resolution; 1,300,000 x maximum magnification. - 2048 x 2048 pixel 16 bit backside illuminated sCMOS with 1.0 e-read noise. 3. **Scanning Transmission Electron Microscope (STEM) Imaging Modes:** - Brightfield and Dark-Field imaging modes included. - 15kV STEM: 1.3nm resolution; 750,000 x maximum magnification. - 10kV STEM: 1.0nm resolution; 940,000 x maximum magnification. 4. **Scanning Electron Microscope (SEM) Imaging Mode:** - Includes beam current measurement at 15kV STEM: 4nm resolution; 750,000 x maximum magnification. Place of Performance Oak Ridge National Laboratory